Facilities

FESEM (JEOL, JSM 6700F model)

SEM (JEOL, 5600 model)

TEM (JEOL, JEM 2010 model)

XRD (Shimadzu, XRD 600 model)

Scanning Probe Microscope (JEOL, JSPM 5200 model)

Focused Ion Beam System (SII Nanotechnolody Inc, SMI3050 model)

BET surface area analyzer (Quantachrome, Autosorb-1)

TG-DTA (Perkin Elmer, Pyris Diamond model)

DSC (Perkin Elmer, Sapphire DSC Standard 115V model)

UV/VIS Spectrometer (Perkin Elmer, Lambda 35 model)

FTIR (Perkin Elmer, Spectrum 100 series model)

Gas Chromatograph (Perkin Elmer, Clarus 500 model)

Spectroscopic Ellipsometer (Ellips, SCE4 model)

Zeta potential analyzer (Malver, Nano Z ZEN2600 model)

Particle Size Analyzer (Malvern, Nano S ZEN1600 model)

Viscotester (ThermoHaake, VT 550 model)

Dynamic Mechanical Analyzer (Perkin Elmer, Pyris Diamond DMA model)

Furnace (Protherm, PLF 160/5 model)

Furnace (Carbolite, ELF 11/14B model)

Oven (Memmert, 100-800 model)

Impact Tester ( Dynisco, API-230-0 model)

Automatic Sample Notcher (ASN) (Dynisco, ASN 230-M model)

Spin Coating Machine (Laurell, WS-400B-6NPP/Lite model)

Dip Coating Machine (Mega, MLT DP 100 model)

Melt Flow Indexer (Dynisco, D4004HV model)

Mini Spray Dryer (Buchi, B-290 model)

Electronic densimeter (Alfa Mirage, MD300S model)